Description

Synopsys Yield Explorer is a design-centric yield management solution designed for product and test engineering teams. It enables users to diagnose performance issues with design data, accelerate learning from silicon debug, accomplish product across multiple wafer sources and test houses, analyze and customize the application using scripting, manage use-case flow between the chart and spreadsheet windows, as well as consolidate and optimize data from fab, test and EDA domains. Features include data analysis, Spreadsheet support, DRC Assistant capability, data extraction management, Tcl/Tk support, and job scheduling capability.